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FIELD EMISSION SCANNING ELECTRON MICROSCOPY (FESEM) FE-SEM is used to analyse morphological and chemical analysis of materials at high magnification by using back-scattered electron image (BSI) and secondary electron image (SEI) systems.
JEOL JSM 7000F Field Emission Scanning Electron Microscope Energy Dispersive Spectroscopy (EDS) And Wavelength Dispersive Spectroscopy (WDS) (Oxford/Inca) Chemical analysis of materials, spot analysis, X-ray phase and dot mapping can be performed. The all elements between boron and uranium can be detected. EBSD (Oxford / Inca) Phase analysis can be performed by electron back-scattered diffraction (EBSD) AUGER ELECTRON SPECTROSCOPY AES is a popular technique for determining the composition of the top few layers of a surface. It cannot detect hydrogen or helium, but is sensitive to all other elements, being most sensitive to the low atomic number elements.
JEOL JAMP 9500F Field Emission Auger Microprobe |
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